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Thursday, May 12, 2011

Designing reliable capacitive-touch interfaces

Capacitive sensing offers an intuitive and robust interface that increases product reliability by eliminating mechanical parts in many appliances (also called "white goods") and instrumentation. Because of their experience with personal electronic devices, many consumers are used to touch interfaces based on capacitive sensing, and they have come to expect these interfaces to be reliable and operate accurately.

Capacitive technology, however, is affected by environmental noise and other factors which can cause systems to not respond to finger touches or to trigger false touches. Unless developers tune sensors, accuracy and reliability can be severely reduced. By understanding how capacitive sensors work and how they can be designed to self-tune themselves to compensate for noise, developers can build robust systems that make their appliances more reliable, cost-effective, and easier to use.

Capacitive Sensing

To understand the challenges behind designing a robust user interface, it helps to first take a brief look at the technology behind a capacitive measurement system. Figure 1 shows a cross-sectional view of a capacitive sensor board.


Figure 1: Cross-sectional view of a capacitive-sensing board

To sense the presence of a finger, a capacitive sensing system must first know the sensor capacitance in the absence of a finger (see Figure 2a), also known as the parasitic capacitance (Cp). When a finger approaches or touches the sensor (see Figure 2b), the sensor capacitance will change, resulting in another capacitance called the finger capacitance (Cf) in parallel to the Cp. In the presence of a finger, the total sensor capacitance (Cx) is given by Equation 1:

Cx = Cp +_ Cf – Equation 1



Figure 2(a): Sensor capacitance in the absence of finger



Figure 2(b): Sensor capacitance in the presence of finger

To be able to analyze the sensor capacitance using a microcontroller, the sensor capacitance (Cx) needs to be converted into a digital value. Figure 3 shows the block diagram of one of the capacitive sensing preprocessing circuit. (Note: There are several methods for measuring sensor capacitance.)



Figure 3: Pre-processing circuit for capacitance measurement

This system uses a switched capacitor block that emulates the sensor capacitance Cx using a resistance Req, a programmable current source (Idac), an external capacitor (Cmod), and a precision analog comparator. The Idac charges Cmod continuously until the voltage on Cmod crosses Vref and the comparator output is high. The Idac is then disconnected and Cmod discharges through Req until the voltage on Cmod drops below Vref. The comparator output is now low until Cmod charges to Vref again. Cx will be greater in the presence of a finger and the emulated Req will be less according to Equation 2:

Req = 1/FsCx – Equation 2

where Fs is the switching frequency of the switched capacitor block.

Thus, when a finger is present, Cmod discharges faster and the comparator output stays high for a shorter time. This means that a higher capacitance value corresponds to a shorter high time for the comparator. The resulting bit stream as shown in Figure 1 can be fed to a counter for a fixed amount of time. This counter value or “raw counts” provides an indication of the magnitude of Cx.

The fixed amount of time for which the counter counts also determines the number of raw counts and can be referred to as the resolution. When the resolution is increased, the counter counts for a longer period of time and this increases the raw counts. Put another way, resolution is also the highest number of raw counts possible.

Tuning

Figure 4 shows the design flow for a capacitive sensor touch interface. However, capacitive sensors must operate in the real world where variations in components, environmental operating conditions, and noise can impact sensor performance and reliability.



Tuning is a critical process for ensuring that a sensor functions correctly and consistently. This is achieved by identifying and determining optimum values for a set of sensor parameters to maintain a sufficient signal-to-noise ratio (SNR) and finger threshold. In general, a 5:1 SNR is the minimum requirement for a robust sensor design (see Figure 5). To avoid false triggering caused by changes in capacitive due to atmospheric changes, a finger threshold of between 65-80% of the signal strength is recommended to ensure reliable finger detection.



Figure 5: Raw sensor data is comprised of finger response and noise. Finger response, also called signal strength, is the difference in raw counts seen by the sensing system when a finger is placed on the sensor.

While sensor controller manufacturers provide guidelines to aid engineers in the tuning process, achieve the ideal tuning parameters for the system involves an iterative process. For a sensor controller with a capacitive sensing algorithm implemented similar to the one shown in Figure 3, the tuning procedure will follow the steps shown in Figure 6.



Developers can implement tuning parameters either by writing code specific to the operation of the sensors in firmware, through external components, or by configuring the controller. With a firmware approach, developers have flexibility; however, whenever tuning parameters need to be changed, the firmware also needs to be modified and updated.

Alternatively, designers can simplify system firmware development by utilizing a fixed-function/non-programmable capacitive sensor controller. Tuning parameters, in this case, must either be implemented using external components on the board or by sending configuration data over a communication interface such as I2C.

With this approach, whenever tuning parameters need to be changed, either the user interface board need to be reworked or configuration data needs to be updated. Developers need to be aware that tuning can be time-consuming, especially if the PCB or overlay needs to be changed between iterations.

Information is shared by www.ideasroad.com

Wednesday, May 11, 2011

Measure the input capacitance of your op amp

Op amps with low input capacitance are required in applications such as smoke detectors, photodiode transimpedance amplifiers, medical instrumentation, industrial control systems, and the piezo-sensor interface. CMOS-input op amps, for instance, require minimal input capacitance when amplifying capacitive-sensor outputs or the small signals from high-impedance sources.

Input capacitance also affects a pole in the feedback path that can cause instability in high-gain, high-frequency applications. By minimizing this input capacitance, you may be able to increase the corresponding pole frequency until it has a negligible effect on the circuit.

Measuring the input capacitance of an op amp isn’t trivial, however; especially if the value is only a few picofarads. Such low values also present difficulties in screening the op amps during production testing. Hence, semiconductor companies often provide only typical values for this parameter, using simulation results and bench measurements on a few known good units. The following discussion can provide a sanity check in the lab by assisting the system-level designer or QA engineer to accurately determine the input capacitance for any op amp.

The direct approach of observing input capacitance on a multimeter isn’t practical below a few nanofarads. A simple yet effective alternative is to insert a large resistor in series with the op-amp input (Figure 1).



Figure 1: A resistor in series with an op amp input enables measurement of the op amp’s input capacitance.

Plotting the frequency response of the resulting first-order lowpass RC filter on a network analyzer (i.e., a Bode plot) lets you calculate the op amp’s input capacitance. Sounds simple, but you must follow precautions to ensure that the measurement accuracy isn’t compromised by stray capacitance in the PC board (PCB) and the test setup.

Follow these tips to minimize stray parasitics:

* Increase the measurement resolution by using only low-capacitance FET probes (<1pF), such as the Tektronix P6245.
* If the series resistor is a surface-mount component, ensure that the board capacitance to ground is as low as possible. (This implies no ground-plane layer beneath the input signal traces and the series resistor.)
* If the series resistor is a through-hole component, bend the input pin so it does not contact the PCB board, and use a short lead length to solder the resistor directly to the op amp input pin.
* Do not use a breadboard in the test setup, because capacitance between the breadboard tracks and jumper wires can degrade the measurement accuracy.
* Use short traces at the input to minimize series inductance.

The hardware recommended for this test setup (Figure 2) includes an Agilent 4395A network analyzer, a Mini-Circuits ZFRSC-2050 power splitter, and a Tektronix P6245 active FET probe.



Figure 2: Test setup for measuring op-amp input capacitance.

First, calibrate the setup with no op amp installed on the PCB. From the resulting Bode plot, you can calculate stray capacitance as Equation 1:



where f1(-3 db) is the corner frequency as measured on the network analyzer with no op amp installed, and RTH1 is the Thevenin-equivalent series resistance. RTH1 is a function of the inserted series resistor, the input termination resistance (50Ω), and the source impedance at the power splitter (50Ω), Equation 2:




Next, install the op amp on the PCB. Since the board’s stray capacitance is in parallel with the op amp’s input capacitance, Equation 1 becomes Equation 3:



where f2(-3 db) is the corner frequency as measured on the spectrum analyzer with the op amp installed, and RTH2 is the Thevenin-equivalent series resistance.

This Thevenin equivalent resistance is a function of the inserted series resistor, the input termination resistance (50Ω), output impedance of the power splitter (50Ω), and the common mode input impedance of the op amp, Equation 4:



The input common mode impedance of an op amp is not accurately known. For a CMOS-input op amp, however, it is fairly easy to select RSERIES << RCM. Then RTH2 ≈ RTH1, and Equation 3 can be rewritten as Equation 5



You can now calculate the op amp’s input capacitance from Equations 1 and 5, and verify the value by repeating the experiment with two different values of series resistor.

To illustrate the method, consider an input-capacitance measurement for the MAX4238 op amp.

Figure 3 shows the amplitude response from Figure 2 using a 200 kΩ series resistor and no op amp installed on the PCB, and Figure 4 shows the amplitude response with the MAX4238 installed.



Figure 3: Amplitude response from Figure 2, with RSERIES = 200 kΩ and no op amp installed on the PCB. The f1(-3dB) frequency is indicated by the downward-pointing arrow.



Figure 4: Amplitude Response from Figure 2, with RSERIES = 200 kΩ and the MAX4238 op amp installed. The f2(-3dB) frequency is indicated by the downward-pointing arrow.

Table 1 summarizes the results, using the frequency-response waveforms and calculations from Equations 1 and 5. As a sanity check, the measurement was repeated with a different series resistor value to demonstrate that a similar result (»4pF) is obtained.



Table 1: Summary of MAX4238 input-capacitance measurements